Lesson 2: Midterm Review Part II – Applied Challenge and Exam Readiness
Duration of Days: 3
Lesson Objective
Students will apply materials, circuit, component, binary, and failure-analysis knowledge in timed, exam-style challenges and reflect on areas requiring final clarification before the midterm
• Can I explain each component’s function precisely?
• Can I analyze a diagram without prompts?
• Can I interpret binary patterns quickly and accurately?
• Can I explain system failure in clear cause-and-effect language?
• Where am I still uncertain?
Resistor
Capacitor
Diode
Inductor
Trace
Closed circuit
Open circuit
Binary
Input
Output
Signal
Processor
Regulation
Failure
HS PS2-6
Communicate scientific and technical information about designed systems.
HS ETS1-2
Evaluate and apply system reasoning to technological problems.
Science and Engineering Practices:
Constructing Explanations
Analyzing and Interpreting Data
Developing and Using Models
Crosscutting Concepts:
Systems and System Models
Cause and Effect
Structure and Function
• Timed reasoning
• Matching vocabulary precisely
• Diagram interpretation
• Logical sequencing
• Multi-step written explanation
Day 1 – Timed Challenge Rounds
Students participate in structured timed rounds aligned to midterm sections
STSM Midterm
:
Round 1 – Vocabulary Precision
Students must define or match components in under 30 seconds each.
Round 2 – Diagram Sprint
Students analyze a simple circuit diagram and answer:
Is it open or closed?
Where is power?
What component regulates flow?
Round 3 – PCB Pathway
Students trace an electrical pathway on a board image and identify at least one regulating component.
Purpose:
Simulate exam pacing and tighten recall accuracy.
DOK: 2–3
Day 2 – Binary and Logic Showdown
Students complete timed binary interpretation problems modeled directly after Section IV
STSM Midterm
:
Interpret 5-bit input strings.
Identify activated actions.
Explain order of operation.
Students then create one binary-controlled system problem for peers.
Class discusses:
Why binary reduces ambiguity.
Why unstable voltage corrupts logic.
Purpose:
Increase speed and confidence in binary reasoning.
DOK: 3
Day 3 – Failure Analysis and Full-System Response
Students respond to a full written prompt modeled after Sections V and VI
STSM Midterm
:
Explain a possible system failure.
Trace it back through regulation, circuitry, and material structure.
Explain effect on output.
Then students answer:
How could a social media decision be modeled as binary logic?
Students self-assess responses using a checklist:
Did I include cause-and-effect?
Did I reference system layers?
Did I use correct terminology?
Purpose:
Prepare for the most cognitively demanding written responses.
DOK: 4
Students connect:
Binary decisions in processors ? Content decisions in algorithms
Voltage regulation ? System stability
Component failure ? Device malfunction
This reinforces interdisciplinary coherence before the exam.
• Mixing up capacitor and inductor.
• Forgetting that diode controls direction.
• Confusing binary position order.
• Giving vague failure explanations without system trace-back.
• Treating processor as independent from circuitry.
Teacher emphasis: clarity, sequence, precision.
• Provide structured answer templates for written sections.
• Allow peer rehearsal before final written response.
• Offer vocabulary quick-reference sheets.
• Provide tiered binary challenges for varied pacing.
• Extension: Multi-layer failure scenario requiring deeper system trace.
Formative Assessments:
• Timed vocabulary accuracy
• Diagram interpretation accuracy
• Binary interpretation correctness
• Structured written failure response
Exit Ticket Prompt:
Write a 4–6 sentence explanation tracing how a material failure could ultimately produce an incorrect digital output.
Evaluation Criteria:
Accuracy of terminology
Logical sequencing
Clear cause-and-effect reasoning
Integration across system levels